BAE Systems' Microwave Test group performs high frequency testing of MMICs and modules for a diverse range of applications at frequencies from 1 to 200 GHz. Test capabilities include:
- Continuous S-parameter test coverage through 110 GHz, 140-220 GHz
- Power, noise figure, and spectral testing (2OIP, 3OIP, etc.) at most frequencies of interest through 94 GHz
- On-wafer testing includes autoprobers, up to 6-inch wafer size
- One-touch test stands for on-wafer testing through 20 GHz. This allows S-parameter, power, noise, and spectral testing all to be performed with a single touchdown of the test probes, minimizing probe-induced damage
- Specialized device characterization capabilities include noise parameter and load pull
- On-wafer testing results in wafer maps and the subsequent yielding/binning of MMICs to customer specifications
The Microwave Test group supports a wide range of projects ranging from production to highly specialized testing of R&D devices, MMICs, and modules.
For further information please contact:
+1 603-885-6785
phillip.m.smith@baesystems.com
